CVE-2025-21449
7.5 highEPSS 0.2%
High (7.5) in qualcomm. EPSS 0.2% chance of exploitation in the next 30 days.
Transient DOS may occur while processing malformed length field in SSID IEs.
Severity
CVSS 3.1
7.5 highCVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H- EPSS
- 0.2% chance of exploitation in the next 30 days; higher than 15% of CVEs (scores of 2026-11-01)
- CWEs
- CWE-125, CWE-126
- Published
- Modified
- Record from
- the NVD, synced
Affected
References
Check your stackJSON