CVE-2024-53017
6.6 mediumEPSS 0.10%
Medium (6.6) in qualcomm. EPSS 0.10% chance of exploitation in the next 30 days.
Memory corruption while handling test pattern generator IOCTL command.
Severity
CVSS 3.1
6.6 mediumCVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L- EPSS
- 0.10% chance of exploitation in the next 30 days; higher than 0% of CVEs (scores of 2026-10-31)
- CWE
- CWE-823
- Published
- Modified
- Record from
- the NVD, synced
Affected
- qualcomm:sdm429w_firmware
- qualcomm:snapdragon_429_mobile_platform_firmware
- qualcomm:wcn3620_firmware
- qualcomm:wcn3660b_firmware
References
Check your stackJSON