cve.bz

CVE-2024-43050

7.8 highEPSS 0.1%

High (7.8) in qualcomm. EPSS 0.1% chance of exploitation in the next 30 days.

Memory corruption while invoking IOCTL calls from user space to issue factory test command inside WLAN driver.

Severity

CVSS 3.1

7.8 high
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
EPSS
0.1% chance of exploitation in the next 30 days; higher than 0% of CVEs (scores of 2026-10-31)
CWEs
CWE-787, CWE-121
Published
Modified
Record from
the NVD, synced

Affected

References

Check your stackJSON