cve.bz

CVE-2022-25696

7.0 highEPSS 0.09%

High (7.0) in qualcomm. EPSS 0.09% chance of exploitation in the next 30 days.

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Severity

CVSS 3.1

7.0 high
CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:U/C:H/I:H/A:H
EPSS
0.09% chance of exploitation in the next 30 days; higher than 0% of CVEs (scores of 2026-10-31)
CWE
CWE-367
Published
Modified
Record from
the NVD, synced

Affected

References

Check your stackJSON