cve.bz

CVE-2019-20607

9.8 criticalEPSS 0.9%

An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).

Severity

CVSS 3.1

9.8 critical
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
EPSS
0.9% chance of exploitation in the next 30 days; higher than 59% of CVEs (scores of 2026-10-31)
CWE
CWE-787
Published
Modified
Record from
the NVD, synced

Affected

References

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