CVSS 3.0
7.8 highCVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HCVE-2018-13888
High (7.8) in qualcomm. EPSS 0.2% chance of exploitation in the next 30 days.
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
Severity
- EPSS
- 0.2% chance of exploitation in the next 30 days; higher than 14% of CVEs (scores of 2026-11-01)
- CWE
- CWE-119
- Published
- Modified
- Record from
- the NVD, synced
Affected
- qualcomm:mdm9206_firmware
- qualcomm:mdm9607_firmware
- qualcomm:mdm9635m_firmware
- qualcomm:mdm9650_firmware
- qualcomm:msm8909w_firmware
- qualcomm:sd_205_firmware
- qualcomm:sd_210_firmware
- qualcomm:sd_212_firmware
- qualcomm:sd_425_firmware
- qualcomm:sd_427_firmware
- qualcomm:sd_429_firmware
- qualcomm:sd_430_firmware
- qualcomm:sd_435_firmware
- qualcomm:sd_439_firmware
- qualcomm:sd_450_firmware
- qualcomm:sd_625_firmware
- qualcomm:sd_636_firmware
- qualcomm:sd_650_firmware
- qualcomm:sd_652_firmware
- qualcomm:sd_670_firmware
- qualcomm:sd_675_firmware
- qualcomm:sd_710_firmware
- qualcomm:sd_712_firmware
- qualcomm:sd_820a_firmware
- qualcomm:sd_835_firmware
- qualcomm:sd_845_firmware
- qualcomm:sd_850_firmware
- qualcomm:sd_855_firmware
- qualcomm:sdm439_firmware
- qualcomm:sdm630_firmware
- qualcomm:sdm660_firmware
- qualcomm:zz_qcs605_firmware