cve.bz

CVE-2017-18297

7.8 highEPSS 0.3%

Double memory free while closing TEE SE API Session management in Snapdragon Mobile in version SD 425, SD 430, SD 450, SD 625, SD 650/52, SD 820.

Severity

CVSS 3.0

7.8 high
CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
EPSS
0.3% chance of exploitation in the next 30 days; higher than 17% of CVEs (scores of 2026-10-31)
CWE
CWE-415
Published
Modified
Record from
the NVD, synced

Affected

References

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